Join the webinar: How to maximize the yield in wafer production

Meet Coco Rogers (Application Engineer) and Markus Setzer (Moderation) to learn:

  • - How Machine Vision can be used to detect defects on a wafer showing a live demo
  • - Which technologies in MVTec HALCON can be used to maximize the yield
  • - How we can support you to start with an automated optical inspection

Register now to attend live or watch the webinar afterwards on demand.

There is a webinar for Europe & Asia, and another for the USA & Canada.

June 05, 2025
Europe & Asia: 9.00 am - 9.30 am CEST
Register here

June 05, 2025
USA & Canada: 2.00 - 2.30 pm EDT
Register here

Video: How to Get Access

View in this step-by-step tutorials how to get access to the MVTec Academy and how to navigate in the platform.